SCANNING PROBE MICROSCOPY OF NDBA2CU3OX THIN-FILM SURFACES

Citation
M. Badaye et al., SCANNING PROBE MICROSCOPY OF NDBA2CU3OX THIN-FILM SURFACES, Applied physics letters, 67(15), 1995, pp. 2155-2157
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
67
Issue
15
Year of publication
1995
Pages
2155 - 2157
Database
ISI
SICI code
0003-6951(1995)67:15<2155:SPMONT>2.0.ZU;2-S
Abstract
We have found that NdBa2Cu3Ox (NBCO) thin films, fabricated by the las er ablation process, have highly stable and smooth surfaces. Clear spi ral patterns with 4-5 terraces are observed all over the film area wit h an atomic force microscope (AFM) operating in air. We have also obta ined atomically resolved image of the spiral terraces using AFM, and a lso using ultrahigh vacuum scanning tunneling microscope. This study s uggests that NBCO film is a good candidate for device applications. (C ) 1995 American Institute of Physics.