NONLINEAR YIELD ANALYSIS AND OPTIMIZATION OF MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS

In this paper, a discussion about nonlinear yield evaluation and nonli near yield optimization of MMIC circuits using a physics-based nonline ar lumped-element MESFET model is presented. The lumped elements of th e MESFET model are directly calculated by closed expressions related t o process parameters, One of the main features of the model is the eas y and effective implementation in commercial CAD tools. It allows the use of nonlinear yield algorithms assuming, as statistical variables, the parameters of the technological process, such as: doping density, gate channel length, etc., maintaining at the same time, the advantage s of lumped-element MESFET model, in particular fast computation end r eduction of convergence problems in harmonic balance for complex circu it topologies.