MEASUREMENTS OF THE SECONDARY-ELECTRON EMISSION OF SUPERCONDUCTING TRANSITIONS AT HELIUM TEMPERATURES BY SCANNING ELECTRON-MICROSCOPY

Authors
TOMASHPOLSKII YY SADOVSKAYA NV SEVOSTYANOV MA NEKHOROSHEV NS PRUTCHENKO SG KOCHETOV AK
Citation
Yy. Tomashpolskii et al., MEASUREMENTS OF THE SECONDARY-ELECTRON EMISSION OF SUPERCONDUCTING TRANSITIONS AT HELIUM TEMPERATURES BY SCANNING ELECTRON-MICROSCOPY, Industrial laboratory, 61(1), 1995, pp. 23-25
Citations number
10
Categorie Soggetti
Materials Science, Characterization & Testing","Instument & Instrumentation
Journal title
Industrial laboratory → ACNP
ISSN journal
00198447
Volume
61
Issue
1
Year of publication
1995
Pages
23 - 25
Database
ISI
SICI code
0019-8447(1995)61:1<23:MOTSEO>2.0.ZU;2-I
Abstract
For the first time the abrupt minimum of the SEE yield from a Bi-Sr-Ca -Cu-O ceramic was observed in the vicinity of the superconducting tran sition. After proper metrological testing, this effect can be used as a basis for a new, sensitive, contactless method for determining a sup erconducting transition that is local in area and depth.