A DE-EMBEDDING TECHNIQUE FOR REFLECTION-BASED S-PARAMETER MEASUREMENTS OF HMICS AND MMICS

Authors
GHANNOUCHI FM BEAUREGARD F HAJJI R BRODEUR A
Citation
Fm. Ghannouchi et al., A DE-EMBEDDING TECHNIQUE FOR REFLECTION-BASED S-PARAMETER MEASUREMENTS OF HMICS AND MMICS, Microwave and optical technology letters, 10(4), 1995, pp. 218-222
Citations number
NO
Categorie Soggetti
Optics,"Engineering, Eletrical & Electronic
Journal title
Microwave and optical technology letters → ACNP
ISSN journal
08952477
Volume
10
Issue
4
Year of publication
1995
Pages
218 - 222
Database
ISI
SICI code
0895-2477(1995)10:4<218:ADTFRS>2.0.ZU;2-6
Abstract
A generalized calibration and de-embedding technique for reflection-ba sed S-parameter measurements of microwave devices is proposed. This te chnique allows two-port calibration of a network analyzer directly fro m the embedded reflection coefficient measurements. This technique is a general one, in the sense that it can be implememted in network anal yzers with or without transmission measurement capabilities. (C) 1995 John Wiley & Sons, Inc.