DETECTION AND ANALYSIS OF DEFECTS IN MONO CRYSTALS AND EPITAXIAL LAYERS BASED ON CDTE BY THE X-RAY TOPOGRAPHY METHODS

Authors
SHULPINA IL ARGUNOVA TS RATNIKOV VV
Citation
Il. Shulpina et al., DETECTION AND ANALYSIS OF DEFECTS IN MONO CRYSTALS AND EPITAXIAL LAYERS BASED ON CDTE BY THE X-RAY TOPOGRAPHY METHODS, Zurnal tehniceskoj fiziki, 65(4), 1995, pp. 180-188
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
Zurnal tehniceskoj fiziki → ACNP
ISSN journal
00444642
Volume
65
Issue
4
Year of publication
1995
Pages
180 - 188
Database
ISI
SICI code
0044-4642(1995)65:4<180:DAAODI>2.0.ZU;2-H