OBSERVATION OF SURFACE RESONANCES ON LAYERED TIS2

Using the target current spectroscopy (TCS) technique, we have measure d the angle-dependent electron absorption spectra of layered TiS2 in t he energy range 0-30 eV. Apart from major angle-dependent structures m anifesting the bulk band structure, the spectra also featured narrow o scillations converging to the emergence thresholds of diffraction beam s. We identified them as due to surface resonances. This effect opens possibilities for accurate determination of surface potential barriers of layered materials.