Fy. Huang et Kl. Wang, STRAIN TRANSFER BETWEEN THIN-FILMS ON BURIED OXIDE AND ITS APPLICATION IN HETEROEPITAXIAL CRYSTAL-GROWTH, Philosophical magazine letters, 72(4), 1995, pp. 231-237
A strain transfer process between two epitaxial thin films with differ
ent lattice constants will be discussed. It is demonstrated that an ep
itaxial film (epifilm) grown on top of a thin buffer layer may release
the strain to the buffer layer, leaving the epifilm dislocation free.
A criterion to achieve this strain transfer is also derived. The stra
in transfer model can explain recent experiments on the growth of low
dislocation relaxed SiGe material on Si. For GaAs-based materials we p
ropose a scheme to form a thin buffer by GaAs situated on top of a bur
ied oxide such as Al2O3 through wet oxidation of AlAs. This GaAs thin
buffer provides a flexible substrate for the growth of epifilms with t
hicknesses not limited by conventional critical thickness for strained
layers. Detailed numerical analysis on the growth of InxGa1-xAs on Ga
As is also performed.