Zn. Dai et al., QUANTITATIVE PIXE AND MICRO-PIXE ANALYSIS OF THICK SAMPLES AT FUDAN-UNIVERSITY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 104(1-4), 1995, pp. 191-195
At Fudan University, the work of quantitative analysis of thick sample
s had already begun in 1977 (Ref. [1], J. Fudan Univ. (Nat. Sci.) 1 (1
977) 73), mainly for the analysis of the sword of Yue Prince Gou Jian.
The software TSPIXE for quantitative analysis of thick samples was co
mpleted in 1992 (Ref. [2], Chin. J. Nucl. Phys. 15 (1993) 133). In thi
s paper the theory and database of the software are described. The sof
tware has been applied to calculate the trace elemental concentrations
of biological, geological and archaeological samples. Some results co
ncerning these samples are presented. Compared to the old version, TSP
IXE II has incorporated secondary fluorescence. Representative results
of the metal analysis considering the secondary fluorescence effect a
re presented. The new version of the software TSPIXE now under program
ming deals with multilayer samples. A preliminary result is also prese
nted.