QUANTITATIVE PIXE AND MICRO-PIXE ANALYSIS OF THICK SAMPLES AT FUDAN-UNIVERSITY

Citation
Zn. Dai et al., QUANTITATIVE PIXE AND MICRO-PIXE ANALYSIS OF THICK SAMPLES AT FUDAN-UNIVERSITY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 104(1-4), 1995, pp. 191-195
Citations number
13
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
104
Issue
1-4
Year of publication
1995
Pages
191 - 195
Database
ISI
SICI code
0168-583X(1995)104:1-4<191:QPAMAO>2.0.ZU;2-E
Abstract
At Fudan University, the work of quantitative analysis of thick sample s had already begun in 1977 (Ref. [1], J. Fudan Univ. (Nat. Sci.) 1 (1 977) 73), mainly for the analysis of the sword of Yue Prince Gou Jian. The software TSPIXE for quantitative analysis of thick samples was co mpleted in 1992 (Ref. [2], Chin. J. Nucl. Phys. 15 (1993) 133). In thi s paper the theory and database of the software are described. The sof tware has been applied to calculate the trace elemental concentrations of biological, geological and archaeological samples. Some results co ncerning these samples are presented. Compared to the old version, TSP IXE II has incorporated secondary fluorescence. Representative results of the metal analysis considering the secondary fluorescence effect a re presented. The new version of the software TSPIXE now under program ming deals with multilayer samples. A preliminary result is also prese nted.