MICRO PIXE AND MICRO SXRF - COMPARISON OF THE 2 METHODS AND APPLICATION TO GLASS INCLUSIONS FROM VULCANO (EOLIAN ISLANDS, ITALY)

PIXE with a 2.5 MeV proton beam of 10 x 10 mu m(2) beam size and Synch rotron Radiation Induced X-ray Emission (SXRF) with photons of 11.8 ke V energy and a focal spot of 5 x 2.5 mu m(2) with especially high inte nsity of 2 x 10(9) photons/s have been performed on synthetic and natu ral volcanic glasses. A comparison of the possibilities and performanc es of these microanalytical methods is made. MDLs are given from the a cquisitions obtained on synthetic glasses. Micro PIXE and micro SXRF w ere jointly applied to the study of trace elements in glass inclusions from the active volcanological system of Vulcano (Eolian Islands - It aly).