EFFECTS OF MICRO-BEAM INDUCED DAMAGE ON SINGLE-EVENT CURRENT MEASUREMENTS

Radiation damage introduced by the impact of heavy-ion micro-beams has been studied in connection with its effects on single-event transient currents, which are measured by the digitizing sampling method combin ed with focused ion micro-beams. It is found that the single-event cur rents decrease with increasing the repetition number of measurements a nd that there exists a linear relationship between the ion fluence and the reciprocal of the normalized single-event charge. A single-event damage equation is deduced, where the damage constant is proportional to the defect density calculated using either the Kinchin-Pease model or the TRIM code. Experimental techniques are developed to eliminate t he effect of radiation damage.