EVALUATION OF THE MOTT POLARIMETER IN THE ELECTRON-SPIN POLARIZATION SCANNING ELECTRON-MICROSCOPY

In order to determine the optimum conditions for the Mott polarimeter which give the highest signal contrast and maximize the electron detec tion efficiency, electron scattering phenomena in the target are quant itatively discussed. The Mott scattering cross section for spin polari zed electrons is used in this analysis. The angular deflection and the spin polarization transfer of electrons for a single scattering event are calculated sequentially using the Monte Carlo method, and three-d imensional trajectories of electrons are simulated. Based on the agree ment with the experimental results of the asymmetry variation with the target thickness, the calculation is extended to determine the optimu m target thickness under a definition of the figure of merit of the Mo tt polarimeter.