EXACT MEASUREMENT OF FLAT SURFACE PROFILES BY OBJECT SHIFTS IN A PHASE-CONJUGATE FIZEAU INTERFEROMETER
Citation
O. Sasaki et al., EXACT MEASUREMENT OF FLAT SURFACE PROFILES BY OBJECT SHIFTS IN A PHASE-CONJUGATE FIZEAU INTERFEROMETER, Optical engineering, 34(10), 1995, pp. 2957-2963
Categorie Soggetti
Optics
SICI code
0091-3286(1995)34:10<2957:EMOFSP>2.0.ZU;2-P
Abstract
We propose a method of exact measurement of flat surface profiles in a
phase-conjugate Fizeau interferometer. Aberration of lenses causes an
undesirable phase distribution in the interference signal of the phas
e-conjugate Fizeau interferometer. To eliminate this phase distributio
n, we shift the object in two directions orthogonal to each other and
we get difference values of the surface profile of the object. Additio
nal displacements of the object surface involved in the shifts lead to
some small errors in the difference values. We estimate an exact surf
ace profile by solving the difference equations. Characteristics of th
e method are made clear through computer simulations and measurements
of a 40-mm-diam flat mirror.