Rn. Viswanath et al., PREPARATION AND CHARACTERIZATION OF ZNO BASED MATERIALS FOR VARISTOR APPLICATIONS, Transactions of the Indian Institute of Metals, 48(3), 1995, pp. 221-224
Zinc oxide based non-ohmic resistors in disc form have been fabricated
for varistor applications. Two series of samples Z1: ZnO (99.5 at %)
+ Bi2O3 (0.5 at %) and Z2: ZnO (99 at %) + Bi2O3 (0.5 at %) + SnO2 (0.
5 at %) have been prepared for the present study. The sintering studie
s on the disc specimens between 800 and 1300 degrees C show that the p
ercentage of linear shrinkage, electrical resistivity and nonlinear ex
ponent are higher In Z2 series than in Z1 series. These measured param
eters and the exhibited breakdown voltage per individual ZnO/ZnO grain
boundary regions varies with sintering. The XRD and SEM results confi
rm that Bi-rich oxide layers are segregated at the ZnO grain boundary
regions. The size of the segregated Bi-rich layers at the grain bounda
ry regions are of the order of nanometer. The resistivity data shows t
hat the segregated layers are insulating in nature which develops nonl
inear current voltage characteristics. These grain boundary layers are
evaporated from the system with increased sintering temperature and t
ime. The increased grain growth, (sizes higher than 15 mu) developed o
n sintering, degrade the varistor characteristics.