This paper discusses the effect of rare-earth ions on the photolumines
cence intensity of amorphous hydrated silicon. Rare-earth impurities s
uppress the intrinsic luminescence by creating a nonradiative recombin
ation center in the mobility gap. Dysprosium is an exception; when it
is introduced in the film-deposition process at a concentration of 0.1
at. %, it increases the luminescence quantum efficiency and produces
a radical reconstruction of the emission spectra. The temperature depe
ndence of the photoluminescence intensity of undoped a-Si:H and of a-S
i:H doped with rare-earth ions is presented. (C) 1995 American Institu
te of Physics.