The total absorption in the spectral ranges 0.5-1.2 mu m and 2.5-25 mu
m, the photoactive absorption in the range 0.5-1.2 mu m, and the phot
oluminescence in porous silicon films separated from the substrate wer
e investigated. It is shown that for most of the experimental samples
the absorption edge is described by a relation that is characteristic
of indirect interband transitions. The observed absence of any correla
tion between the energy position of the absorption edge and the photol
uminescence band is explained by the fact that absorption of radiation
occurs within nanocrystals of porous silicon, whereas the photolumine
scence emerges from a thin chemical film on the surface of the porous
silicon. (C) 1995 American Institute of Physics.