ELECTRONIC-STRUCTURE OF CHALCOGENIDE COMPOUNDS FROM THE SYSTEM TL2S-SB2S3 STUDIED BY XPS AND XES

X-ray photoelectron (XPS) and soft X-ray emission (XES) spectroscopies have been used as complementary methods to study the electronic struc ture of TI2S, Sb2S3, TISb2 and TISb3S5. XPS provides the binding energ y (BE) of core levels as well as the total valence band (VB) distribut ions; XES probes the S 3p VB density of states. S 2p core level study shows that the charge transfer to sulphur atoms is noticeably higher i n TI2S than in Sb2S3 and ternary compounds. From a comparison of XPS a nd XES results, we conclude that S 3p states are located near the top of the band in all cases; the results are discussed with reference to density of state calculations.