USE OF ANOMALOUS DIFFRACTION, DAFS AND DANES TECHNIQUES FOR SITE-SELECTIVE SPECTROSCOPY OF COMPLEX OXIDES

Citation
J. Vacinova et al., USE OF ANOMALOUS DIFFRACTION, DAFS AND DANES TECHNIQUES FOR SITE-SELECTIVE SPECTROSCOPY OF COMPLEX OXIDES, Journal of synchrotron radiation, 2, 1995, pp. 236-244
Citations number
17
Categorie Soggetti
Instument & Instrumentation","Physics, Applied",Optics
ISSN journal
09090495
Volume
2
Year of publication
1995
Part
5
Pages
236 - 244
Database
ISI
SICI code
0909-0495(1995)2:<236:UOADDA>2.0.ZU;2-0
Abstract
The diffraction anomalous fine structure (DAFS) technique is applied t o highly absorbing 'real' crystals of arbitrary shape containing sever al heavy atoms. A multiwavelength refinement procedure of DAFS signals is demonstrated on two different oxides, BaPt1-2x4+(Pt1-y2+Bay2+)(x)O -3-3x with x = 0.25, y similar or equal to 0 and BaZnFe6O11, which hav e complex crystallographic structures. In these compounds, anomalous s catterers are located in different crystallographic sites and thus a m ultiwavelength refinement is necessary to separate out the site-select ive information. An accurate absorption correction procedure for small , highly absorbing single crystals necessary for the DAFS analysis of this kind of samples is also presented.