J. Vacinova et al., USE OF ANOMALOUS DIFFRACTION, DAFS AND DANES TECHNIQUES FOR SITE-SELECTIVE SPECTROSCOPY OF COMPLEX OXIDES, Journal of synchrotron radiation, 2, 1995, pp. 236-244
The diffraction anomalous fine structure (DAFS) technique is applied t
o highly absorbing 'real' crystals of arbitrary shape containing sever
al heavy atoms. A multiwavelength refinement procedure of DAFS signals
is demonstrated on two different oxides, BaPt1-2x4+(Pt1-y2+Bay2+)(x)O
-3-3x with x = 0.25, y similar or equal to 0 and BaZnFe6O11, which hav
e complex crystallographic structures. In these compounds, anomalous s
catterers are located in different crystallographic sites and thus a m
ultiwavelength refinement is necessary to separate out the site-select
ive information. An accurate absorption correction procedure for small
, highly absorbing single crystals necessary for the DAFS analysis of
this kind of samples is also presented.