Using the new ''Troika'' x-ray undulator beamline at the European Sync
hrotron Radiation Facility, we have succeeded in measuring coherent di
ffraction (''speckle'') patterns from artificial multilayers. The patt
erns are unusual in that they are unremarkable in the scan direction p
erpendicular to the Bragg angle, showing a single peak of the width of
the Fraunhofer maximum, but have dramatic structure in the direction
of the Bragg angle. This is shown to be consistent with the extreme as
ymmetry of the geometry that causes more than one well-ordered domain
of the sample to fall within the coherently illuminated region. The pa
tterns are sufficiently simple that we are able to model them reasonab
ly well by fitting explicit phase parameters to a fixed number of illu
minated ''blocks.'' Two fitting procedures are described that may have
some general utility.