This paper reports a novel high voltage Conductivity Modulated Thin-Fi
lm Transistor (CMTFT) fabricated using polycrystalline silicon, The tr
ansistor uses the idea of conductivity modulation in the offset region
to obtain a significant reduction in on-state resistance, Experimenta
l on-state and off-state current-voltage characteristics of the CMTFT
have been compared,vith those of the conventional offset drain device,
Results show that the CMTFT has six times to more than three orders o
f magnitude higher on-state current handling capability for operating
at drain voltages ranging from 15 V to 5 V while still maintaining low
leakage current and providing even faster switching speed, The CMTFT
devices can be fabricated using a low temperature process (620 degrees
C) which is highly desirable for large area electronic applications.