CLUSTER IRRADIATION OF MULTILAYERS - MIXING BY ELECTRONIC-ENERGY DEPOSITION

Citation
N. Layadi et al., CLUSTER IRRADIATION OF MULTILAYERS - MIXING BY ELECTRONIC-ENERGY DEPOSITION, Physical review letters, 75(18), 1995, pp. 3301-3304
Citations number
23
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
75
Issue
18
Year of publication
1995
Pages
3301 - 3304
Database
ISI
SICI code
0031-9007(1995)75:18<3301:CIOM-M>2.0.ZU;2-J
Abstract
The interaction of C-6(+) cluster ions (energy around 500 keV/atom) wi th SiO-Ni multilayers induces interface mixing near the surface, due t o the highly nonlinear energy deposition into the electron bath when c luster breakup occurs. The mixing is strikingly anisotropic (in the di rection of particle motion). A very large SiO surface layer erosion co efficient (up to 100) and roughness are found in the same experiments.