LATTICE ACCOMMODATION OF LOW-INDEX PLANES - AG(111) ON SI(001)

Citation
M. Hornvonhoegen et al., LATTICE ACCOMMODATION OF LOW-INDEX PLANES - AG(111) ON SI(001), Physical review. B, Condensed matter, 52(15), 1995, pp. 10764-10767
Citations number
21
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
52
Issue
15
Year of publication
1995
Pages
10764 - 10767
Database
ISI
SICI code
0163-1829(1995)52:15<10764:LAOLP->2.0.ZU;2-W
Abstract
Deposition of nonreacting metals on semiconductors usually results in three-dimensional islands that often exhibit a different crystal orien tation than the substrate. Using the kinetic pathway of low-temperatur e growth, a continuous and smooth Ag film with a (111) orientation is formed on Si(001). The interface planes fit nearly exactly within a (3 x4) unit cell of the Si(001) surface. The remaining small mismatch is adjusted by periodic arrays of interfacial defects. The orientation of the Ag(111)-film is strictly determined by the orientation of the Si bonds: From step to step of the Si(001) substrate the Ag(111) crystall ites rotate by 90 degrees.