DETERMINISTIC ANALYTICAL METHOD FOR THE CALIBRATION OF SEMICONDUCTOR-DETECTORS IN GAMMA-RAY SPECTROMETRY

Authors
GENICOT JL HARDEMAN F WAETERMANS F
Citation
Jl. Genicot et al., DETERMINISTIC ANALYTICAL METHOD FOR THE CALIBRATION OF SEMICONDUCTOR-DETECTORS IN GAMMA-RAY SPECTROMETRY, Radiation protection dosimetry, 61(1-3), 1995, pp. 141-144
Citations number
NO
Categorie Soggetti
Radiology,Nuclear Medicine & Medical Imaging","Nuclear Sciences & Tecnology
Journal title
Radiation protection dosimetry → ACNP
ISSN journal
01448420
Volume
61
Issue
1-3
Year of publication
1995
Pages
141 - 144
Database
ISI
SICI code
0144-8420(1995)61:1-3<141:DAMFTC>2.0.ZU;2-A
Abstract
A simple to use computer program (called ATT3D) to calculate the detec tor efficiency for any type of geometry and material is described. The requested data are a point geometry efficiency and the description of the detector's and sample's geometries. This program, adapted for a 4 86 computer or for a workstation, can be used in different application s and especially in body burden assessment by the direct method (whole -body counting). The accuracy depends on the description of the geomet ry which can be adapted by changing the mesh size when high precision is requested.