THE STRUCTURE OF ARTIFICIAL GRAIN-BOUNDARIES IN YTTRIUM STABILIZED ZRO2 BICRYSTALS WITH INTERMEDIATE LAYERS

Results of transmission electron microscopy and X-ray microanalysis in vestigation of artificial grain boundaries (AGBs) in Y-stabilized ZrO2 (YSZ) bicrystals with different intermediate layers are described. Do ping elements and intermediate layers were introduced by depositing th in films on the contact surfaces of YSZ crystals prior to the solid ph ase intergrowth. Depending on the amount and type of deposited materia l doped AGB, continuous intermediate layer, or nanoscale precipitates at the AGB can be obtained. The orientation of the bicrystal parts aff ect the structure of the AGB. For relatively small misorientation of a djacent parts faceting and formation of different types of dislocation s are revealed. The structures of interfaces between the YSZ and inter mediate layers are considered.