The current-voltage characteristics of -Ag\RbAg4I5\C+ cell are measure
d and described in terms of a model assuming that the electron current
across the electrochemical cell is essentially defined by the transfe
r of electrons through the interface. The position of the Fermi level
in the band gap and the value of the electronic conductivity sigma(e)
similar or equal to 2.5 x 10(-9) Omega(-1) cm(-1) are determined. The
role of the near contact region and silver dendritic clusters in the p
rocess of electron transport in RbAg4I5 superionic crystals are studie
d. The onset of the exponential rise of the current at increasing volt
age V (at V greater than or equal to 450 mV) is described within the m
odel based on the conception that the silver dendritic clusters fracta
lly grow at the interface. It is shown that the increase of the voltag
e leads to growth of the effective interface area (due to the cluster
structure formation) and as a result to the exponential increase of th
e current through the cell at V greater than or equal to 450 mV. At co
nstant voltage on the cell we observed experimentally the electronic c
urrent instability. We suppose that at this voltage some of the cluste
rs reach the opposite electrode that leads to stochastic current oscil
lations. The number of these clusters increases with the voltage growt
h and therefore the current oscillations become more frequent. All exp
erimental data are well described within the framework of the theory o
f reversible diffusion limited aggregation without branching.