G. Venturini et al., NEUTRON-DIFFRACTION STUDY OF ND0.35LA0.65MN2SI2 - A SMMN2GE2-LIKE MAGNETIC-BEHAVIOR COMPOUND, Journal of magnetism and magnetic materials, 150(2), 1995, pp. 197-212
Magnetization and neutron diffraction measurements on the ThCr2Si2-typ
e structure Nd0.35La0.65Mn2Si2 compound are reported. This compound is
characterized by re-entrant ferromagnetic behaviour, as observed in t
he SmMn2Ge2 compound, with three characteristic magnetic transitions a
t T-C = 295 K, T-t1 = 220 K (F --> AF) and T-t2 = 50 K (AF --> F). Neu
tron diffraction study reveals the occurrence of an additional antifer
romagnetic region (not detected by magnetometric measurements) charact
erized by antiferromagnetic (001) Mn planes, between T-C = 295 K and T
-N = 395 K. On the other hand, the occurrence of an in-plane antiferro
magnetic Mn component (obviously correlated with a critical Mn-Mn intr
alayer spacing value of similar to 2.87 Angstrom) over the whole order
ed range leads us to strongly revise the ferromagnetic ordering previo
usly proposed to take place on the Mn sublattice in such compounds, A
new description of the thermal dependence of the Mn sublattice magneti
c orderings within the RMn(2)X(2) (X = Si, Ge) compounds is proposed.