SINGLE-ATOM ELECTRON-EMISSION FROM THE SILICON TIP COATED BY CALCIUM-FLUORIDE WITH SAMARIUM DOPANT IONS

We present the first experimental results of the studying of field ele ctron emission from sharp silicon tips covered by thin dielectric CaF2 layers containing Sm dopant ions. Some indications on the resonant tu nneling of electrons from sharp silicon tip through dopant samarium io ns inside the coating have been observed, which can be regarded as an implementation of one-atom electron source of a new type, based on die lectric coating of emitting tip.