A. Hamoudi et al., CONTROLLED DISORDERING OF COMPRESSIVELY STRAINED INGAASP MULTIPLE-QUANTUM WELLS UNDER SIO-P ENCAPSULANT AND APPLICATION TO LASER-MODULATOR INTEGRATION, Journal of applied physics, 78(9), 1995, pp. 5638-5641
We investigated the potentiality of a phosphorus-doped silicon oxide (
SiO:P) carrier-free disordering source for applications in photonic de
vices integration schemes. This is accomplished in three successive st
eps by employing an InGaAsP/InGaAsP structure with compressively strai
ned wells and lattice-matched barriers designed for operation around s
imilar to 1.55 mu m. First of ail, we showed that the SiO:P encapsulan
t offers a good control over a wide range of disorder (blue shifts as
high as similar to 150 meV). Later on, the high optical quality of the
disordered regions is demonstrated by detecting 300 K excitonic featu
res in moderately blue-shifted (similar to 40 meV) samples. And, final
ly, a first attempt of its application in integration technology is ma
de by realizing a monolithic composite of a distributed feedback laser
and a quantum-confined stark effect electroabsorption modulator opera
ting around 1.54 mu m. (C) 1995 American Institute of Physics.