Mj. Hayward et al., SPUTTERED PROTONS DURING SURFACE-INDUCED DISSOCIATION (SID) TANDEM MASS-SPECTROMETRY (MS MS)/, International journal of mass spectrometry and ion processes, 148(1-2), 1995, pp. 25-30
Citations number
8
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
A new tandem mass spectrometer has been constructed for the study of i
on/surface interactions and the study of surface induced dissociation
processes. During the development and initial testing of this new inst
rument, experiments have been carried out using a stainless steel surf
ace under high vacuum(10(-7)-10(-8) Torr) conditions where hydrocarbon
s (pump oil) would be expected to be adsorbed onto the surface. A surp
rising result of these experiments has been the observation of sputter
ed protons. The yield of sputtered protons remains relatively constant
with varying incident ion kinetic energy (over the 20-100 eV range) a
nd appears to have little or no dependence on momentum transfer from t
he incident ions. These findings provide direct evidence (via observat
ion of an excess of the charged intermediate protons) for a charge exc
hange mechanism for associative ion/surface reactions involving proton
ation. However, the yield of protonated products (protonated pyridazin
e ions) due to associative ion/surface reactions is dependent on incid
ent ion kinetic energy. These results suggest that the protonation of
pyridazine may depend on interaction times at the surface which, in tu
rn, depend on the depth of penetration of the incident species into th
e hydrocarbon overlayer. In addition, the observation of sputtered pro
tons as the likely intermediates to associative ion/surface protonatio
n reactions may have implications for the proposed mechanisms of ion/s
urface reactions where alkylation of incident ions occurs.