TEMPERATURE-DEPENDENCE OF THE FREE-EXCITON-EMISSION LINEWIDTH IN HIGH-PURITY INP

Citation
R. Benzaquen et al., TEMPERATURE-DEPENDENCE OF THE FREE-EXCITON-EMISSION LINEWIDTH IN HIGH-PURITY INP, Physical review. B, Condensed matter, 52(4), 1995, pp. 2273-2276
Citations number
12
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
52
Issue
4
Year of publication
1995
Pages
2273 - 2276
Database
ISI
SICI code
0163-1829(1995)52:4<2273:TOTFLI>2.0.ZU;2-8
Abstract
Temperature-dependent photoluminescence measurements have been perform ed to study the linewidth of the n=1 free-exciton transition in a high -purity n-type InP epilayer. The spectra reveal that the linewidth of the emission from upper-branch polaritons broadens rapidly when the te mperature increases, while that of lower-branch polaritons narrows in the temperature range of 20-30 K. These results, which cannot be expla ined within the framework of the standard polariton transport model, a re well reproduced by a phenomenological model that takes into account polariton scattering by bound excitons, ionized impurities, and phono ns.