ANISOTROPIC ROUGHENING OF VICINALLY MISCUT AG(110) - X-RAY-REFLECTIONPROFILE ANALYSIS USING THE DOMAIN-MATRIX METHOD

Citation
S. Pflanz et al., ANISOTROPIC ROUGHENING OF VICINALLY MISCUT AG(110) - X-RAY-REFLECTIONPROFILE ANALYSIS USING THE DOMAIN-MATRIX METHOD, Physical review. B, Condensed matter, 52(4), 1995, pp. 2914-2926
Citations number
44
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
52
Issue
4
Year of publication
1995
Pages
2914 - 2926
Database
ISI
SICI code
0163-1829(1995)52:4<2914:AROVMA>2.0.ZU;2-8
Abstract
The roughening behavior of a vicinally miscut Ag(110) surface has been studied with x-ray diffraction using synchrotron radiation. The later al profiles recorded at different q(perpendicular to) were analyzed wi th (a) the domain-matrix method, an evaluation scheme for diffraction profiles, and (b) using a conventional power-law profile shape analysi s. Both methods result in a roughening temperature of T-R=900+/-20 K ( =0.73T(m)). The type of the roughening transition is consistent with t he predictions of the anisotropic body-centered solid-on-solid (=six-v ertex) model with step creation energies of J(x)=45+/-3 meV and J(y)=6 0+/-3 meV along [(1) over bar 10] and [001], respectively. At low temp eratures, a two-component (bimodal) step distribution corresponding to a bunching of steps is identified.