J. Simsova et al., THICKNESS DEPENDENCE OF DOMAIN PERIOD IN BACOXTIYFE12-X-YO19, Journal of magnetism and magnetic materials, 148(1-2), 1995, pp. 247-248
The thickness dependence of the domain period in pure and Co/Ti doped
BaM hexaferrite polycrystalline films and wedge form single crystal pl
atelets is studied by the colloid-SEM (scanning electron microscope) m
ethod. Experimental data on equilibrium domain periods are compared wi
th the theoretical ones. Theoretical extrapolation allows to estimate
the 'critical' film thickness below which the equilibrium domain perio
d increases for various compositions.