DESIGN OF AUTONOMOUS TPG CIRCUITS FOR USE IN 2-PATTERN TESTING

Authors
FURUYA K SEKI S MCCLUSKEY EJ
Citation
K. Furuya et al., DESIGN OF AUTONOMOUS TPG CIRCUITS FOR USE IN 2-PATTERN TESTING, IEICE transactions on information and systems, E78D(7), 1995, pp. 882-888
Citations number
NO
Categorie Soggetti
Computer Science Information Systems
Journal title
IEICE transactions on information and systems → ACNP
ISSN journal
09168532
Volume
E78D
Issue
7
Year of publication
1995
Pages
882 - 888
Database
ISI
SICI code
0916-8532(1995)E78D:7<882:DOATCF>2.0.ZU;2-5
Abstract
A method to design one-dimensional cellular arrays to be used as TPG c ircuits of BIST is described. The interconnections between cells are n ot limited to adjacent ones but allowed to some neighbors. Completely regular structures that have full-transition coverages for every k-dim ensional subspace of state variables are first shown. Then, almost reg ular arrays which can operate on maximum cycles are derived based on F ast parallel implementations of LFSRs.