DEGRADATION MECHANISM OF IMPREGNATED CATHODES

Citation
N. Mita et K. Shimokawa, DEGRADATION MECHANISM OF IMPREGNATED CATHODES, Electronics & communications in Japan. Part 2, Electronics, 78(2), 1995, pp. 106-112
Citations number
12
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
8756663X
Volume
78
Issue
2
Year of publication
1995
Pages
106 - 112
Database
ISI
SICI code
8756-663X(1995)78:2<106:DMOIC>2.0.ZU;2-1
Abstract
To better understand the degradation mechanism of impregnated cathodes , chemical compositions of impregnated cathodes after extended usage w ere analyzed using a newly devised integral method. The results indica te that cathode degradation is caused by a decrease in Pa supply rate. This decrease is caused by an inward drift of the reaction front as t he reaction between an impregnant and a tungsten substrate proceeds. I t is also confirmed that the Pa supply rate is controlled by the Knuds en flow of Pa atoms. To compare cathode lives economically, a new diod e tube has been designed with an anode that has a taper hole. The diod e tube allowed economical measurement of cathode performance (which is almost identical to that of a traveling wave tube (TWT)). The testing of diode tubes confirms that it is possible to estimate the lives of the cathodes with various compositions by the method based on Delta T- 90. The methodology has been applied to identify the cathode with the longest life from four impregnated cathodes employed in satellite appl ications.