N. Mita et K. Shimokawa, DEGRADATION MECHANISM OF IMPREGNATED CATHODES, Electronics & communications in Japan. Part 2, Electronics, 78(2), 1995, pp. 106-112
To better understand the degradation mechanism of impregnated cathodes
, chemical compositions of impregnated cathodes after extended usage w
ere analyzed using a newly devised integral method. The results indica
te that cathode degradation is caused by a decrease in Pa supply rate.
This decrease is caused by an inward drift of the reaction front as t
he reaction between an impregnant and a tungsten substrate proceeds. I
t is also confirmed that the Pa supply rate is controlled by the Knuds
en flow of Pa atoms. To compare cathode lives economically, a new diod
e tube has been designed with an anode that has a taper hole. The diod
e tube allowed economical measurement of cathode performance (which is
almost identical to that of a traveling wave tube (TWT)). The testing
of diode tubes confirms that it is possible to estimate the lives of
the cathodes with various compositions by the method based on Delta T-
90. The methodology has been applied to identify the cathode with the
longest life from four impregnated cathodes employed in satellite appl
ications.