Ph. Schavemaker et L. Vandersluis, THE INFLUENCE OF THE TOPOLOGY OF TEST CIRCUITS ON THE INTERRUPTING PERFORMANCE OF CIRCUIT-BREAKERS, IEEE transactions on power delivery, 10(4), 1995, pp. 1822-1828
High-voltage circuit breakers are tested in the High Power Laboratory
where transient recovery voltages (TRVs) are generated by networks con
sisting of lumped elements. In the DEC and ANSI standards the TRV wave
forms are described, but not the topology of the test circuits. This p
aper compares different direct TRV test circuits which generate the sa
me initial part of the TRV waveform. It is demonstrated that the surge
impedance of the TRV test circuit is an important parameter. The diff
erence in interrupting performance of the TB in the test circuits with
the different surge impedances is caused by the influence of the are-
circuit interaction.