X-RAY-DIFFRACTION STRUCTURAL-ANALYSIS OF LANGMUIR-BLODGETT-FILMS USING A PATTERN-RECOGNITION APPROACH

Citation
E. Maccioni et al., X-RAY-DIFFRACTION STRUCTURAL-ANALYSIS OF LANGMUIR-BLODGETT-FILMS USING A PATTERN-RECOGNITION APPROACH, Thin solid films, 265(1-2), 1995, pp. 74-83
Citations number
35
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
265
Issue
1-2
Year of publication
1995
Pages
74 - 83
Database
ISI
SICI code
0040-6090(1995)265:1-2<74:XSOLU>2.0.ZU;2-A
Abstract
A new approach for the analysis of X-ray diffraction patterns to obtai n the structure of Langmuir-Blodgett (LB) films is reported. In partic ular, to solve the ''phase problem'' we apply a direct method, essenti ally a pattern recognition approach, which was recently proposed to de termine without assumptions the structure of liquid-crystalline phases , This approach is used to analyse two different types of samples, nam ely LB films of fatty acid salts and of bipolar lipids extracted from thermoacidophilic archaeon Sulfolobus solfataricus. As a result, the e lectron density profiles allow us to fully characterize the molecular arrangement in both the investigated films.