LAYER SELECTIVE MAGNETOMETRY IN ULTRATHIN MAGNETIC-STRUCTURES BY POLARIZED NEUTRON REFLECTION

We discuss the application of polarised neutron reflection to layer se lective vector magnetometry measurements in thin magnetic films. To il lustrate the application of PNR, we review recent measurements of the absolute moment in X/Fe/Ag(001) structures with X=Pd, Ag, Au and Cu an d compare the results with the predictions based on theoretical calcul ations which take into account the measured interface roughness. For t he case of strained fct Ni/Cu(001) structures we illustrate the use of PNR as a self-calibrating magnetometric technique in determining both the magnetic layer thickness and total sample moment for which a redu ced moment per Ni atom is observed. Finally we present measurements of the layer dependent moments in FeNi/Cu/Co spin valve structures. We s how that by comparing the PNR measurements with SQUID magnetometry mea surements of the total sample moment we are able to determine the inte rface moments on an atomic scale.