GdFe amorphous layers have been prepared with well defined in-plane ma
gnetic anisotropy. The best results were obtained when the sample was
deposited on glass substrate kept at 90 K during the deposition proces
s. When the substrate was kept at room temperature the anisotropy is l
ess well defined and a perpendicular anisotropy component appears as t
he thickness of the layer increases. The effect of the position of the
sample during the preparation is shown.