CORRELATION BETWEEN TOPOGRAPHIC AND MAGNETIC-PROPERTIES OF ELECTROCHEMICALLY PREPARED NICKEL FILMS

The correlation between the structural and the magnetic properties are investigated on electrodeposited Ni films on (111) textured gold buff er layers on mica and glass substrates. The topological characteristic s of the film surface are analyzed by atomic force microscopy (AFM) an d the corresponding magnetic behavior is studied by ferromagnetic reso nance (FMR). The FMR linewidth is found to depend strongly on the thic kness of the Ni film samples and on the topography of the underlying g old film. Confrontation with AFM results indicate a loss in the latera l coherence length for the thinner Ni films.