S. Hong et al., MAGNETOOPTIC KERR-EFFECT MEASUREMENTS ON FE3-XCOXSI LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-2.5) EPITAXIALLY STABILIZED ON SI(111), Journal of magnetism and magnetic materials, 165(1-3), 1997, pp. 212-215
200 Angstrom thick Fe3-xCoxSi (0 less than or equal to x less than or
equal to 2.5) films have been epitaxially grown on Si(111) by co-depos
ition at room temperature. Low- and medium-energy electron diffraction
indicate the formation of cubic silicides with a crystallinity compar
able to that of epitaxial alpha-Fe on Si(111). These silicides form a
random alloy as evidenced by the lack of DO3-type long-range order, us
ually observed in the Fe3Si stoichiometric compound. Using ex situ mag
neto-optic Ken effect, hysteresis curves for different magnetic field
directions have been measured at room temperature. The data demonstrat
e ferromagnetic behavior with strong in-plane uniaxial anisotropy in s
pite of the threefold symmetry of the cubic structure of these Fe3-xCo
xSi silicides. The easy axis is found to be parallel to the [-101] dir
ection.