ENGINEERING MAGNETIC RESPONSES IN HCP COBALT THIN-FILMS

We have analyzed the local and global magnetic properties of high qual ity grown (0001) hcp cobalt films of thicknesses varying from 50 to 50 0 nm. Local domain imaging by magnetic force microscopy together with magnetization measurements confirm the periodic multidomain structure with perpendicular orientation predicted by Kittel for such thicknesse s and allow a full characterization of the film. The perpendicular and parallel saturation fields have been successfully modeled and fitted. The magnetic domain width of between a few tens of nanometers to a fe w hundreds of nanometers is described using a root h law, where h is t he film thickness. Well characterized cobalt films appear to be good c andidates for further investigations.