RESONANT-TUNNELING IN THE PRESENCE OF A 2-LEVEL FLUCTUATOR - LOW-FREQUENCY NOISE

We study current noise in a double-barrier resonant-tunneling structur e due to dynamic defects that switch states because of their interacti on with a thermal bath. The time fluctuations of the resonant level re sult in low-frequency noise, the characteristics of which depend on th e relative strengths of the electron escape rate, the coupling to the defects, and the defect's switching rate. If the number of defects is sufficiently large, the noise is of the 1/f type. It is shown that the temperature dependence of the noise intensity becomes more pronounced as the spacer gets thicker.