IN-SITU HIGH-RESOLUTION ELECTRON-MICROSCOPY OBSERVATIONS OF NANOMETER-SIZED PB INCLUSIONS IN AL NEAR THEIR MELTING-POINT

Citation
Sq. Xiao et al., IN-SITU HIGH-RESOLUTION ELECTRON-MICROSCOPY OBSERVATIONS OF NANOMETER-SIZED PB INCLUSIONS IN AL NEAR THEIR MELTING-POINT, Journal of Microscopy, 180, 1995, pp. 61-69
Citations number
17
Categorie Soggetti
Microscopy
Journal title
ISSN journal
00222720
Volume
180
Year of publication
1995
Part
1
Pages
61 - 69
Database
ISI
SICI code
0022-2720(1995)180:<61:IHEOON>2.0.ZU;2-T