THICKNESS OF A SILICA-TETHERED POLY(ETHYLENE OXIDE) LAYER MEASURED BYSPIN-LABELING

Citation
H. Hommel et al., THICKNESS OF A SILICA-TETHERED POLY(ETHYLENE OXIDE) LAYER MEASURED BYSPIN-LABELING, Journal of polymer science. Part B, Polymer physics, 33(16), 1995, pp. 2189-2198
Citations number
43
Categorie Soggetti
Polymer Sciences
ISSN journal
08876266
Volume
33
Issue
16
Year of publication
1995
Pages
2189 - 2198
Database
ISI
SICI code
0887-6266(1995)33:16<2189:TOASPO>2.0.ZU;2-W
Abstract
EPR spectroscopy of labeled poly(ethylene oxide) (PEO) grafted on sili ca has been used to characterize the conformation and local dynamics o f the chains. Grafted molecules of MW 2000 with grafting ratios of 0.0 45, 0.057, 0.126, and 0.42 molecules/nm(2) were in contact with benzen e. The mobility of the label was compared with that observed for solut ion of PEO from very diluted to highly concentrated and even bulk PEG. Thus, the concentration inside the grafted layer could be evaluated a nd also the thickness, which evolves rather linearly with the grafting ratio. (C) 1995 John Wiley & Sons, Inc.