K. Higashitani et al., AN OPTICAL METHOD TO DETECT AMOUNT OF PARTICLES DEPOSITED OM A SUBSTRATE, Journal of Chemical Engineering of Japan, 28(5), 1995, pp. 501-505
It is examined whether the principle of reflectometry, developed to me
asure the thickness of a thin layer oh a surface, is applicable to det
ecting quantitatively the amount of fine particles deposited on a subs
trate, It is found that the relative difference of parallel and perpen
dicular components of the laser beam reflected on the surface is propo
rtional to the particle coverage if experimental conditions are suitab
ly selected, and that this principle is able to be used to detect with
high sensitivity in-situ the amount of particles.