AN OPTICAL METHOD TO DETECT AMOUNT OF PARTICLES DEPOSITED OM A SUBSTRATE

Citation
K. Higashitani et al., AN OPTICAL METHOD TO DETECT AMOUNT OF PARTICLES DEPOSITED OM A SUBSTRATE, Journal of Chemical Engineering of Japan, 28(5), 1995, pp. 501-505
Citations number
10
Categorie Soggetti
Engineering, Chemical
ISSN journal
00219592
Volume
28
Issue
5
Year of publication
1995
Pages
501 - 505
Database
ISI
SICI code
0021-9592(1995)28:5<501:AOMTDA>2.0.ZU;2-L
Abstract
It is examined whether the principle of reflectometry, developed to me asure the thickness of a thin layer oh a surface, is applicable to det ecting quantitatively the amount of fine particles deposited on a subs trate, It is found that the relative difference of parallel and perpen dicular components of the laser beam reflected on the surface is propo rtional to the particle coverage if experimental conditions are suitab ly selected, and that this principle is able to be used to detect with high sensitivity in-situ the amount of particles.