ORIGINS AND EFFECTS OF THERMAL-PROCESSES ON NEAR-FIELD OPTICAL PROBES

Citation
Ah. Larosa et al., ORIGINS AND EFFECTS OF THERMAL-PROCESSES ON NEAR-FIELD OPTICAL PROBES, Applied physics letters, 67(18), 1995, pp. 2597-2599
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
67
Issue
18
Year of publication
1995
Pages
2597 - 2599
Database
ISI
SICI code
0003-6951(1995)67:18<2597:OAEOTO>2.0.ZU;2-U
Abstract
An aluminum-coated tapered fiber probe, as used in near-field scanning optical microscopy (NSOM), is heated by the light coupled into it. Th is can destroy the probe or may modify the sample, which can be proble matic or used as a tool. To study these thermal effects, we couple mod ulated visible light of various power through probes. Simultaneously c oupled infrared light senses the thermal effects. We report their magn itude, their spatial and temporal scales, and real-time probe damage o bservations. A model describes the experimental data, the mechanisms f or induced IR variation, and their relative importance. (C) 1995 Ameri can Institute of Physics.