HIGH-TEMPERATURE DIAMOND P-N-JUNCTION - B-DOPED HOMOEPITAXIAL LAYER ON N-DOPED SUBSTRATE

Citation
Th. Borst et al., HIGH-TEMPERATURE DIAMOND P-N-JUNCTION - B-DOPED HOMOEPITAXIAL LAYER ON N-DOPED SUBSTRATE, Applied physics letters, 67(18), 1995, pp. 2651-2653
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
67
Issue
18
Year of publication
1995
Pages
2651 - 2653
Database
ISI
SICI code
0003-6951(1995)67:18<2651:HDP-BH>2.0.ZU;2-0
Abstract
Boron-doped homoepitaxial layers have been selectively grown on synthe tic type Ib substrates of (100) cut. Ohmic contacts were formed by eva porating a Mo/Pt/Au sandwich and subsequent annealing at 950 degrees C for 1/2 h. Current-voltage characteristics of diode type could be tak en in vacuum in the temperature range 360-900 degrees C. Green light e mission due to electroluminescence was observed from the junction area showing a maximum at a wavelength of 534 nm corresponding to a photon energy of 2.32 eV. The normalized emission spectrum was measured over the temperature range 320-440 degrees C with the device in air and wa s found independent of temperature and baron concentration. (C) 1995 A merican Institute of Physics.