OBSERVATION OF INTRINSIC JOSEPHSON-JUNCTION PROPERTIES ON (BI,PB)SRCACUO THIN-FILMS

We have fabricated intrinsic Josephson junctions for (Bi,Pb)(2)Sr2Ca2C u3Ox thin films and investigated their electronic characteristics. Mes a structures with the junctions are fabricated on the surface of high- quality films prepared by rf-sputtering and subsequent heat treatment. The junctions show distinct hysteresis and a multiple branching struc ture with a periodic voltage jump at a current-voltage response. These results demonstrate that the fabricated mesas consist of stacked seri es SIS junctions. From this periodic structure, a voltage jump of 26-2 8 mV is obtained for the 2223 phase at 4.2 K.