A deformation stage capable of fully reversed fatigue loading for use
in the scanning electron microscope (SEM) is described. This stage inc
orporates a novel surface displacement transducer for the detection of
acoustic emission (AE) signals, which has a flat response over a wide
band and can be used as a receiver up to 12 MHz. Also described is a
method for analysis of these signals to obtain the size, speed, and lo
cation of the source event. A special grip geometry is introduced such
that the dynamic Greens function describing the surface displacement
at the transducer contains an initial p-wave delta function which is u
tilized to determine the source properties.