SENSITIVITY OF SILVER FILMS TO H2S CONTAMINATION - ELLIPSOMETRIC AND CONDUCTIVITY STUDIES

Authors
VASSILEV L VULCHEV V LJUTOV L RUSSEV S
Citation
L. Vassilev et al., SENSITIVITY OF SILVER FILMS TO H2S CONTAMINATION - ELLIPSOMETRIC AND CONDUCTIVITY STUDIES, Sensors and actuators. B, Chemical, 28(3), 1995, pp. 223-226
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
Journal title
Sensors and actuators. B, Chemical → ACNP
ISSN journal
09254005
Volume
28
Issue
3
Year of publication
1995
Pages
223 - 226
Database
ISI
SICI code
0925-4005(1995)28:3<223:SOSFTH>2.0.ZU;2-4
Abstract
We have studied the growth of Ag2S film on the top of silver layers in dilute H2S gas ambient by ellipsometric and resistivity measurements simultaneously. The Ag2S film thickness and the normalized resistivity change [R(t)-R(0)]R(t) follow one and the same time dependence, which allows us to use the latter as an indicator for the H2S gas concentra tion. The method possesses higher sensitivity at low (tens of ppm) pol luting-gas concentrations.