TEMPERATURE-DEPENDENT X-RAY-DIFFRACTION STUDY OF LATTICE VIBRATIONAL BEHAVIOR IN BI-SYSTEM SUPERCONDUCTOR

Authors
CHEN X MA RZ CAO GH LI Y
Citation
X. Chen et al., TEMPERATURE-DEPENDENT X-RAY-DIFFRACTION STUDY OF LATTICE VIBRATIONAL BEHAVIOR IN BI-SYSTEM SUPERCONDUCTOR, Solid state communications, 96(12), 1995, pp. 957-959
Citations number
11
Categorie Soggetti
Physics, Condensed Matter
Journal title
Solid state communications → ACNP
ISSN journal
00381098
Volume
96
Issue
12
Year of publication
1995
Pages
957 - 959
Database
ISI
SICI code
0038-1098(1995)96:12<957:TXSOLV>2.0.ZU;2-9
Abstract
Temperature dependent X-ray diffraction is carried out in order to stu dy lattice vibrational behavior in Bi1.6Pb0.4Sr2Ca2Cu3-xFexOy (x=0 and 0.08 respectively). The study focuses attention on the (002) diffract ion peak. The lattice parameters and the anomalous behavior of the int ensity of the (002) peak show the existence of a lattice softening eff ect at approximately 130 and 200 K. The samples with different values of T-c show different vibrational behavior.